Implementation of a high reflectivity multilayered mirror for near infrared

(TiO2 / MgF2) ( / ) (4 10-6 mbar). (98%) (1.2m) .The spectral reflectivity of a deposited multilayer with variable refractive indices of thin films ( TiO2 / MgF2) was studied . The layers were deposited by electron beam evaporation technique under a pressure of (4 10-6 mbar) . The experimental measurements showed that by increasing the number of deposited layers of ( TiO2 / MgF2 ) , the reflectivity was increased. The reflectivity was found to be (98%) at the wavelength of (1.2m), where many application using this wavelength are deployed.